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Posts Tagged ‘Reliability’
Background
The Radiation Effects Group (RER) at Vanderbilt University was established in 1987 and is the largest program of its kind in the U.S. It is the only academic program actively involved in supporting the Department of Defense (DOD) in radiation effects for strategic applications, and one of a very few programs involved in microelectronics research...... KEEP READING
Posted on Tuesday, August 16th, 2011 in | Tags: Defense, Electronics, Engineering, ISDE, Radiation Effects, Reliability, RER, Space, Vanderbilt Comments Off on Background
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