Radiation Effects and Reliability Group

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2005 Conference Presentations

D. Cochran, S. Kniffin, R. L. Ladbury, Christian Poivey, T. L. Irwin, M. A. Carts, M. O’Bryan, S. Buchner, C. Palor, B. DiBari, K. A. LaBel, C. Marshall, R. A. Reed, A. B. Sanders, D. Hawkins, R. J. Flanigan, S. R. Cox, P. W. Marshall, “Recent Total Ionizing Dose Results and Displacement Damage Results for Candidate Spacecraft Electronics for NASA,” Accepted for publication, Radiation Effects Data Workshop, 2004 IEEE , 2005.

D. M. Fleetwood, X. J. Zhou, L. Tsetseris, S. T. Pantelides, and R. D. Schrimpf, “Hydrogen model for negative-bias temperature instabilities in MOS gate insulators”, PV 2005-01 – ISBN 1-56677-459-4 – Silicon Nitride and Silicon Dioxide Thin Insulating Films and Other Emerging Dielectrics VIII, edited by R. E. Sah, M. J. Deen, J. Zhang, J. Yota, and Y. Kamakura, pp. 267-278 (2005).

D. M. Fleetwood, H. D. Xiong, and J. S. Lin, “1/f noise in SOI buried oxides and alternative dielectrics to SiO2”, in Noise in Devices and Circuits III, edited by A. A. Balandin, F. Danneville, M. J. Deen, and D. M. Fleetwood, Vol. 5844, The Society for Optical Engineering (SPIE, Bellingham, 2005), pp. 63-74.

M. Alles, R. D. Schrimpf, D. M. Fleetwood, R. A. Reed, and B. Jun, “Recent radiation issues in SOI Devices”, PV 2005-03 – ISBN 1-56677-461-6 – Silicon-on-Insulator Technology and Devices XII, edited by G. K. Celler, S. Cristoloveanu, J. G. Fossum, F. Gamiz, K. Izumi, and Y-W. Kim, pp. 87-98 (2005).

M. L. Alles, D. R. Ball, R. D. Schrimpf, D. M. Fleetwood, R. A. Reed, and B. Jun, “Recent Radiation Issues in Silicon-on-Insulator Devices,” in Silicon-on-Insulator Technology and Devices XII, vol. PV 2005-03, G. K. Celler, Ed. Quebec City, Canada: Electrochemical Society, 2005, pp. 87-98.

R. Pasternak, B. Jun, R. D. Schrimpf, D. M. Fleetwood, M. Alles, R. Dolan, R. Standley, and N. Tolk, “Investigation of second-harmonic generation for SOI wafer metrology”, PV 2005-03 – ISBN 1-56677-461-6 – Silicon-on-Insulator Technology and Devices XII, edited by G. K. Celler, S. Cristoloveanu, J. G. Fossum, F. Gamiz, K. Izumi, and Y-W. Kim, pp. 383-388 (2005).

R.A. Reed, R.A. Weller, R.D. Schrimpf, and L.W. Massengill, “Application of the RADSAFE Concept to Investigate Single Event Effect Basic Mechanisms in Modern Technologies,” presented at JOWOG 36, May 16-20, 2005, Scientific Applications & Research Associates Inc., Cypress CA

R.A. Weller, R.A. Reed, R.D. Schrimpf, and L.W. Massengill, “RADSAFE – Status, Issues, Outlook,” presented at JOWOG 36, May 16-20, 2005 Scientific Applications & Research Associates Inc., Cypress CA

 

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