A. Sternberg, L. Massengill, S. Buchner, R. Pease, Y. Boulghassoul, “Sensitivity classification of analog single-event transients”, submitted to RADECS 2002.

A. Sternberg, L. Massengill, S. Buchner, R. Pease, Y. Boulghassoul, and M. Savage, “Importance of parasitic elements for analog single-event transient simulations”, presented at Single-Event Effect Symposium, April 2002.

A.M. Al-badri, D.G. Walker, R.D. Schrimpf and T.S. Fisher, “Single-Event Failure in Power Diodes,’’ International Mechanical Engineering Congress and Exposition, New Orleans, LA, November, 2002.

C. R. Cirba, H. J. Barnaby, J. M. Hutson, J. A. Felix, R. D. Schrimpf, and D. M. Fleetwood, “Modeling Oxide Trapped Charge Annealing Processes In Irradiated SOI MOSFETs,” in GOMAC Dig., pp. 496-499, 2002.

D. R. Ball, H. J. Barnaby, and R. D. Schrimpf, “Analysis of Proton Radiation Damage in Bipolar Transistors Using Gate Control,” in GOMAC Dig., pp. 500-503, 2002.

D. R. Ball, H. J. Barnaby, and R. D. Schrimpf, “Analysis of Proton Radiation Damage in Bipolar Transistors Using Gate Control,” in GOMAC Dig., pp. 500-503, 2002.

H. J. Barnaby, R. D. Schrimpf, K. F. Galloway, D. R. Ball, R. L. Pease, and P. Fouillat, “Test Structures for Analyzing Radiation Effects in Bipolar Technologies,” in Proc. Int. Conf. Microelectronic Test Structures, pp. 197-201, 2002.

L. Massengill, S. Buchner, R. Pease, Y. Boulghassoul, “Sensitivity classification of analog single-event transients”, submitted to RADECS 2002.

M. Savage, T. Turflinger, J. Titus, H. Barsun, Y. Boulghassoul, L. Massengill, A. Sternberg, R. Pease, “Variations in SET pulse shapes in the LM124A and LM111”, accepted for presentation at NSREC 2002

P. Adell, R. D. Schrimpf, B. K. Choi, T. Holman and J. Attwood : “Total Dose and Single Event Effect in DC/DC switching power converter”, presented as a poster at the IEEE NSREC (Nuclear and Space Radiation Effects Conference), 2002

P. C. Adell, C. R. Cirba, H. J. Barnaby, R. D. Schrimpf, X. Zhu, T. Holman, and O. Mion: “Single Event Transient in a voltage reference” presented at the SEE symposium 2002

R. Pease, A. Sternberg, Y. Boulghassoul, L. Massengill, S. Buchner, D. McMorrow, D. Walsh, G. Hash, “Comparison of Single Event Transients in Bipolar Linear Circuits Using a Microbeam, Laser and Circuit Simulations” Presented at Single-Event Effect Symposium, April 2002

S. Buchner, D. McMorrow, A. Sternberg, L. Massengill, M. Maher, C. Poivey, R. Koga, J. Forney, J. Howard, K. LaBel, “Characterization of single-event transients in the LM119 voltage comparator”, presented at Single-Event Effect Symposium, April 2002.

Y. Boulghassoul, L. Massengill, A. Sternberg, R. Pease, S. Buchner, J. Howard, D. McMorrow, M. Savage, C. Poivey, “Circuit modeling of the LM124 operational amplifier for single-event transient predictions” accepted for presentation at NSREC 2002.

Y. Boulghassoul, L. Massengill, A. Sternberg, S. Buchner, J. Howard, M. Savage, R. Pease, “Extraction of an ASET SPICE model for the LM124 operational amplifier”, presented at the Single-Event Effect Symposium, April 2002

Y. Boulghassoul, L. Massengill, T. Holman, “Frequency related effects of analog single-event transients in linear circuits”, accepted for presentation at NSREC 2002.

Y. Boulghassoul, L. Massengill, T. Holman, “Frequency domain analysis of analog SET in the LM124 operational amplifier” ,to be published in SEE Symposium 2002 proceedings.