A. L. Sternberg, L. W. Massengill, R. D. Schrimpf, Y. Boulghassoul, H.J. Barnaby, S. Buchner, R. L. Pease, and J. W. Howard, “Effect of Amplifier Parameters on Single-Event Transients in an Inverting Operational Amplifier,” in RADECS Proc., 2001.

A. Sternberg, L. Massengill, R. Schrimpf, Y. Boulghassoul, H. Barnaby, S. Buchner, R. Pease, J. Howard, Dependence of amplifier parameters on single-event transients in the LM124, presented at RADECS conference, September 2001

A. Sternberg, L. Massengill, R. Schrimpf, P. Calvel, Dependence of Single Event Transients on Circuit Application in the LM111 Comparator, Presented at NSREC 2001

A. Sternberg, L. Massengill, R. Schrimpf, Y. Boulghassoul, H. Barnaby, S. Buchner, R. Pease, J. Howard, Dependence of amplifier parameters on single-event transients in an inverting operational amplifier, Accepted for publication in IEEE TNS and RADECS Proceedings

A. Sternberg, L. Massengill, R. Schrimpf, P. Calvel, “Dependence of Single Event Transients on Circuit Application in the LM111 Comparator”, Presented at NSREC 2001

A. Sternberg, L. Massengill, R. Schrimpf, Y. Boulghassoul, H. Barnaby, S. Buchner, R. Pease, J. Howard, “Dependence of amplifier parameters on single-event transients in the LM124”, presented at RADECS conference, September 2001

A. Sternberg, L. Massengill, R. Schrimpf, Y. Boulghassoul, H. Barnaby, S. Buchner, R. Pease, J. Howard, “Dependence of amplifier parameters on single-event transients in an inverting operational amplifier”, accepted for publication in IEEE TNS and RADECS Proceedings.

H. J. Barnaby, R. Briand, P. Fouillat, V. Pouget, H. Lapuyade, and Dean Lewis, University of Bordeaux, Talence, P. Adell, TRAD Test and Radiation, Toulouse, and R. D. Schrimpf, “Pulsed Laser for the Characterization of Single-Event Transients in Linear Bipolar Microcircuits.” Vanderbilt University. Nanospace conference 2001

H. J. Barnaby, R. Briand, P. Fouillat, V. Pouget, H. Lapuyade, and Dean Lewis, University of Bordeaux, Talence, P. Adell, TRAD Test and Radiation, Toulouse, and R. D. Schrimpf, Vanderbilt University. “Pulsed Laser for the Characterization of Single-Event Transients in Linear Bipolar Microcircuits.” Nanospace conference 2001

J. Boch, F. Saign, T. Maurel, F. Giustino, L. Dusseau, R. D. Schrimpf, K.F. Galloway, J. P. David, R. Ecoffet, J. Fesquet, and J. Gasiot, “Dose and Dose Rate Effects on NPN Bipolar Junction Transistors Irradiated at High Temperature,” in RADECS Proc., 2001.

J. Boch, F. Saigne, T. Maurel, F. Giustino, L. Dusseau, R. D. Schrimpf, K.F. Galloway, J. P. David, R. Ecoffet, J. Fesquet, and J. Gasiot, “Dose and Dose Rate Effects on NPN Bipolar Junction Transistors Irradiated at High Temperature,” in RADECS Proc., to be published, 2001.

R. D. Schrimpf, “From Defects to Devices: Radiation Effects in Electronics,” in GOMAC Digest, pp. 137-140, 2001. (invited)

R. D. Schrimpf, “From Defects to Devices: Radiation Effects in Electronics,” in GOMAC Digest, pp. 137-140, 2001. (invited)

R. Marec, C. Chatry, P. Adell, C. Barillot, P. Calvel and O. Mion: “Single Event Transient Hardness Assurance Methodology”. Published at the RADECs 2001

R. Marec, C. Chatry, P. Adell, C. Barillot, P. Calvel and O. Mion: “Single Event Transient Hardness Assurance Methodology”. Published at the RADECs 2001

S. Buchner, D. McMorrow, A. Sternberg, L. Massengill, R. Pease, M. Maher, Single-event transient (SET) characterization of a LM119 voltage comparator: an approach to SET model validation using a pulsed laser, presented at RADECS conference, September 2001

S. Buchner, D. McMorrow, A. Sternberg, L. Massengill, R. Pease, M. Maher, “Single-event transient (SET) characterization of a LM119 voltage comparator: an approach to SET model validation using a pulsed laser”, presented at RADECS conference, September 2001