D. G. Walker, J. Liu, T. S. Fisher, and R. D. Schrimpf, “Thermal Characterization of Single Event Burnout Failure in Semiconductor Power Devices,” in Proc. 16th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMITHERM), pp. 213-219, 2000.

H. J. Barnaby, C. Cirba, R. D. Schrimpf, K. F. Galloway, M. Pagey, and R. Milanowski, “A Two Dimensional Engineering Model for Radiation-Induced Interface Trap Formation,” in GOMAC Digest, pp. 613-616, 2000.

H. J. Barnaby, C. Cirba, R. D. Schrimpf, K. F. Galloway, M. Pagey, and R. Milanowski, “A Two Dimensional Engineering Model for Radiation-Induced Interface Trap Formation,” in GOMAC Digest, pp. 613-616, 2000.

R. Marec, P. Adell, C. Barillot, O. Mion, Alcatel: C. Chatry, TRAD R. Ecoffet, Centre National d’Etudes Spatiales, “Application Oriented Radiation Evaluation of Linear Integrated Circuits” presented at IEEE NSREC 2000

R. Marec, P. Adell, C. Barillot, O. Mion, Alcatel: C. Chatry, TRAD R. Ecoffet, Centre National d’Etudes Spatiales, “Application Oriented Radiation Evaluation of Linear Integrated Circuits” presented at IEEE NSREC 2000