D. M. Fleetwood and P. S. Winokur (SNL), “Radiation Effects in the Space Telecommunications Environment”, Proceedings of the 22nd Annual Conference on Microelectronics, edited by N. Stojadinovic, Nis, Yugoslavia, 1999. [Invited]

H. J. Barnaby, C. Cirba, R. D. Schrimpf, S. Kosier, P. Fouillat, and X. Montagner, “Modeling BJT Radiation Response with Non-Uniform Energy Distributions of Interface Traps,” in RADECS Proc., pp. 75-79, 1999.

H. J. Hjalmarson, P. A. Schultz, D. J. Bowman, and D. M. Fleetwood (SNL), “A Unified Computational Approach to Oxide Aging Processes, in Multiscale Modeling of Materials”, eds: T. Diaz de la Rubia, T. Kaxiras, V. Bulatov, N. M. Ghoniem, and R. Philips, Vol. 538 (Materials Research Society, Warrendale PA, 1999), pp. 257-262.

J. Hofmeister, H. G. Parks, B. Vermeire, Z. Murshalin, R. Graves, R. D. Schrimpf, and K. F. Galloway, “Concept and Initial Feasibility of Contamination TCAD by Integration with Commercial Software,” in Proc. 10th Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference, pp. 426-429, 1999.

J. Liu, R. D. Schrimpf, L. Massengill, K. F. Galloway, and J. O. Attia, “Circuit-Level Model for Single-Event Burnout in N-Channel Power MOSFETs,” in RADECS Proc., pp. 173-179, 1999.

P. E. Bunson, R. D. Schrimpf, M. Di Ventra, and S. T. Pantelides, “Diffusion of H in SiO2 : An Ab-Initio Study,” presented at APS March Meeting, 1999.

P. Paillet, V. Ferlet-Cavrois, J. R. Schwank, and D. M. Fleetwood, “Response of SIMOX and Unibond Buried Oxides: Trapping and Detrapping Properties,” Proc. 5th European Conference on Radiation and Its Effects on Components and Systems, Fontevraud, France, Sept. 13-17, 1999, pp. 328-332.

R. Milanowski, M. Pagey, J. Conley, L. Massengill, R. Schrimpf, and K. Galloway, “Total Dose Radiation-Effects Simulation Using Three-Carrier Transport in SiO2 ,” in GOMAC Digest, pp. 758-761, 1999.

S. K. Mukundan, M. P. Pagey, R. D. Schrimpf, and K. F. Galloway, “Simulation of hot-carrier degradation using self-consistent solution of semiconductor energy-balance equations and oxide carrier transport equations,” in Integrated Reliability Workshop Final Report, pp. 92-97, 1999.