A. N. Campbell, K. A. Peterson, D. M. Fleetwood, and J. M. Soden (SNL), “Effects of Focused Ion Beam Irradiation on MOS Transistors”, IEEE International Reliability Physics Sympos. Proc., IEEE No. 97CH35983, 72-81 (1997).

J. R. Schwank (SNL), M. J. Anc (Ibis Technology), M. R. Shaneyfelt, B. L. Draper, T. L. Meisenheimer, W. L. Warren (SNL), K. Vanheusden (AF Research Lab), D. M. Fleetwood, and L. P. Schanwald (SNL), “Improving ITOX Conditions for Low Defect Density and BOX Breakdown”. 1997 IEEE International SOI Conference Proceedings, pp. 14-15, Yosemite, CA, October 1997.

J. Y. Ahn, W. T. Holman, R. D. Schrimpf, K. F. Galloway, D. A. Bryant, P. Calvel, and M.-C. Calvet, “Design Issues for a Radiation-Tolerant Digital to-Analog Converter in a Commercial 2.0-�m BiCMOS Process,” in RADECS Proc., pp. 120-125, 1997.

K. Vanheusden, W. L. Warren, W. M. Shedd, R. D. Pugh, D. M. Fleetwood, J. R. Schwank, and R. A. B. Devine, “Characterization of Interface Traps in SOI Material, 1997 IEEE International SOI Conference Proceedings”, pp. 64-65, Yosemite, CA, October 1997.

K. Vanheusden, W. L. Warren, R. A. B. Devine, D. M. Fleetwood, J. R. Schwank, P. S. Winokur, and Z. J. Lemnios, “Direct Observation of Mobile Protons in SiO2 Thin Films: Potential Application in a Novel Memory Device, in Amorphous and Crystalline Insulating Thin Films”, Vol. 446, edited by W. L. Warren, R. A. B. Devine, M. Matsumura, S. Cristoloveanu, Y. Homma, and J. Kanicki (Materials Research Society, Pittsburgh, PA, 1997), pp. 187-192.

K.T. Henegar, L.W. Massengill, E. Garcia, and D.V. Newton, “Auto-Pulsing Power Driver for Piezoelectric Stack Actuators,” Government Microcircuit Applications Conference Digest of Papers, vol. XXII, March 1997.

L.W. Massengill, M.S. Reza, B.L. Bhuva, and T.L. Turflinger, “Upset Cross-Section Modeling in Combinational CMOS Logic Circuits,” HEART Digest of Papers, vol. XXII, March 1997.

L.W. Massengill, “Challenges in Modeling Soft Errors in Complex Sequential Logic,” invited presentation at the 1997 NASA/Sematech/SRC Symposium on Soft Errors, Radiation Effects, and Reliability in VLSI (Invited Presentation).

M. Simons (RTI), R. L. Pease (RLP Research), D. M. Fleetwood, J. R. Schwank (SNL), M. F. Krzesniak, T. L. Turflinger (NSWC Crane), J. Buaron (RTI), L. C. Riewe (SNL), W. T. Kemp, P. W. C. Duggan (Phillips Lab), A. H. Johnston, M. C. Wiedeman (JPL), R. E. Mills (Hughes), A. G. Holmes-Seidle (REM), L. M. Cohn (DSWA), J. J. Doane, and W. L. Lohmeier (Univ. Arizona), “Common-Source TLD and RADFET Characterization of Co-60, Cs-137, and X-ray Irradiation Sources”, 1997 IEEE Radiation Effects Data Workshop Record, IEEE No. 97TH8293, pp. 28-34 (1997). Outstanding Poster Award, 1997 IEEE Radiation Effects Data Workshop.

X. Montagner, R. Briand, P. Fouillat, R. D. Schrimpf, A. Touboul, K. F. Galloway, M. C. Calvet, and P. Calvel, “Dose-Rate and Irradiation Temperature Dependence of BJT SPICE Model Rad-Parameters,” in RADECS Proc., pp. 216-222, 1997.