Radiation Effects and Reliability Group

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1995 Conference Presentations

D. M. Fleetwood, “A First Principles Approach to Total Dose Hardness Assurance,” in Advanced Qualification Techniques: A Practical Guide for Radiation Testing of Electronics, ed. J. R. Schwank, IEEE Nuclear and Space Radiation Effects Conf. Short Course, Madison, WI, pp. III: 1-69 (1995).

F.K. Chai, R.D. Schrimpf, J.R. Brews, D.P. Birnie, III, K.F. Galloway, R.N. Vogt, and M.N. Orr, “Effects of Scaling Thickness and Niobium Doping Level on Ferroelectric Thin Film Capacitor Memory Operation,” in IEDM Tech. Dig., pp. 123-126, 1995.

I. Mouret, M.-C. Calvet, P. Calvel, P. Tastet, M. Allenspach, K. A. LaBel, J. L. Titus, C. F. Wheatley, R. D. Schrimpf, and K. F. Galloway, “Experimental Evidence of the Temperature and Angular Dependence in SEGR,” in RADECS 95 Proc., pp. 313-320, 1995.

R. D. Schrimpf, “Recent Advances in Understanding Total-Dose Effects in Bipolar Transistors,” in RADECS 95 Proc. (Invited Presentation), pp. 9-18, 1995.

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