D. Zupac, K.W. Baum, R.D. Schrimpf, and K.F. Galloway, “Detection of ESD-Induced Noncatastrophic Damage in P-Channel Power MOSFETs,” in EOS/ESD Symp. Proc., 1991, pp. 151-157.

L.W. Massengill, “A Dynamic CMOS Multiplier for Analog VLSI Based on Exponential Pulse-Decay Modulation,” invited publication in the IEEE Journal of Solid State Circuits, March, 1991. (Invited Publication).

P. S. Winokur and D. M. Fleetwood (SNL), “Total Dose Radiation Hardness Assurance for Space Electronics,” Proc. 8th Symposium on Space Nuclear Power Systems, Albuquerque, NM, Jan. 7-10, 1991.

R. Craigin, J. Schmid, C. Damianou, J. Hohl, R. Schrimpf, H. Parks, J. Ramberg, N. Brown, and R. Jones, “Electrically Monitoring Chemical Contamination,” in Proc. Sixth Symp. on Automated Integrated Circuits Manufacturing, V. E. Akins and H. Harada, Eds., Pennington, NJ: The Electrochemical Society, 1991, pp. 317-328.

R.N. Nowlin, R.D. Schrimpf, E.W. Enlow, W.E. Combs, and R.L. Pease, “Mechanisms of Ionizing-Radiation-Induced Gain Degradation in Modern Bipolar Devices,” in Proc. 1991 IEEE Bipolar Circuits and Tech. Mtg., 1991, pp. 174-177.