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1990 Conference Presentations
D. Zupac, K.W. Baum, W. Weber, R.D. Schrimpf, and K.F. Galloway, “ESD Effects on the Radiation Response of Power VDMOS Transistors,” in EOS/ESD Symposium Proc., 1990, pp. 137-142.
H. Lendenmann, R.D. Schrimpf, and A.D. Bridges, “Novel Test Structure for the Measurement of Electrostatic-Discharge Pulses,” in Proc. IEEE Int. Conf. on Microelectronic Test Structures, 1990, pp. 149-153.
J. Schmid, R. Craigin, C. Damianou, J. Hohl, R. Schrimpf, H. Parks, J. Ramberg, N. Brown, and R. Jones, “A Simple Model for Estimating Allowable Transition Metal Contamination Levels in DRAMs,” in Proc. SRC Techcon, 1990, pp. 263-266.
L.W. Massengill, “A Dynamic CMOS Multiplier for Analog Neural Network Cells,” Proceedings of the IEEE Custom Integrated Circuits Conference, May, 1990.
L.W. Massengill, “Multiplexed, Charge-Based Circuits for Analog Neural Systems,” Proceedings of the International Joint Conference on Neural Networks, January, 1990.
L.W. Massengill and D.B. Mundie, “Analog Neural Network Implementations Using Active, Distributed Charge Injection Techniques,” invited publication in the Proceedings of the 1990 Conf. on Systems, Man, and Cybernetics, Nov. 1990. (Invited Publication)
M.L. Alles, K.L. Jones, J.E. Clark, J.C. Lee, W.F. Kraus, S.E. Kerns, and L.W. Massengill, “SOI/SRAM Rad-Hard Design Using a Predictive SEU Device Model,” GOMAC Conference Digest of Papers, Las Vegas, November 1990.
M.L. Alles, J.C. Lee, L.W. Massengill, and S.E. Kerns, “High Frequency Diffusion Capacitance in SOI/SEU Modeling,” Proceedings of the 1990 SOI/SOS Conference, November, 1990.
N. Kaul, L.W. Massengill, and S.L. Shelby, “A General Purpose Simulation Environment for Multiplexed, Multilayer Neural Networks,” Proceedings of the First Workshop on Neural Networks, Feb. 1990.
N.V. Barbara, R.D. Schrimpf, and W.J. Kerwin, “Ionizing-Radiation-Induced Degradation in Electronic Power Amplifiers,” in Conf. Record of the IEEE Industry Applications Society Meeting, 1990, pp. 1667-1672.
R.D. Schrimpf, S.C. Lee, K.F. Galloway, S.L. Rainwater, and J.P. Retzler, “Circumvention-Hardened Field-Effect Transistors,” in Government Microcircuit Applications Conference Digest of Papers, 1990, pp. 439-442.
S.L. Kosier, D. Zupac, R.D. Schrimpf, F.E. Cellier, K.F. Galloway, M.N. Darwish, C.A. Goodwin, and M.C. Dolly, “Optimization of a Two-Level Field-Plate Termination Structure for Integrated-Power Applications in Ionizing Radiation Environments,” in Government Microcircuit Applications Conference Digest of Papers, 1990, pp. 435-438.
S.W. Welch, R.G. Brown, F.M. Wells, A.B. Bonds, L.W. Massengill, and K.R. Fernandez, “Fault Tolerant Behavior of I2T Parallel Computing Network,” Proceedings of the International Joint Conference on Neural Networks, January, 1990.
W. Weber, R.D. Schrimpf, R.G. Myers, A.F. Witulski, and K.F. Galloway, “Radiation-Induced Changes in Power-MOSFET Gate-Charge Measurements,” in Conf. Record of the IEEE Industry Applications Society Meeting, 1990, pp. 1673-1678.
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