Radiation Effects and Reliability Group

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1989 Conference Presentations

D. M. Fleetwood and S. S. Tsao (SNL), “Silicon-on-Insulator Electronics for a Space Nuclear Power System”, in Space Nuclear Power Systems 1988, eds. M. S. El-Genk and M. D. Hoover (Orbit Book Co., Malabar, FL, 1989), pp. 477-80.

M.J. Martinez, J.P. Retzler, S.L. Rainwater, R.D. Schrimpf, and K.F. Galloway, “Hardness Enhancement for Power DMOS,” in Government Microcircuit Applications Conference Digest of Papers, 1989, pp. 385-387.

M.L. Alles, S.E. Kerns, L.W. Massengill, D.V. Kerns, T.W. Houston, H. Lu, and L.R. Hite, “Characterization of Single-Event Vulnerability of CMOS-SOI Transistors,” Government Microcircuit Applications Conference Digest of Papers, vol XV, Nov. 1989.

P.J. Wahle, R.D. Schrimpf, and K.F. Galloway, “Simulated Space Radiation Effects on Power MOSFETs in Switching Power Supplies,” in Conf. Record of the IEEE Industry Applications Society Meeting, 1989, pp. 1221-1226.

R.D. Schrimpf, P.W.C. Hsueh, H. Lendenmann, and J.N. Fordemwalt, “Electrostatic-Discharge Detectors,” in 1989 EOS/ESD Symp. Proc., 1989, pp. 84-87.

 

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