Radiation Effects and Reliability Group

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1988 Conference Presentations

D. M. Fleetwood and P. V. Dressendorfer (SNL), “The Effect of Elevated Temperature on Irradiated Metal-Oxide-Semiconductor (MOS) Devices”, in Space Nuclear Power Systems 1987, eds. M. S. El-Genk and M. D. Hoover (Orbit Book Co., Malabar, FL, 1988), pp. 349-53.

L.W. Massengill, S.E. Kerns, and M.A. Xapsos, “The Response of Resistive-Load SRAMs to Dose-Rate Environments,” Government Microcircuit Applications Conference Digest of Papers, vol. XIV, Nov. 1988.

 

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