Radiation Effects and Reliability Group

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1987 Conference Presentations

D. M. Fleetwood (SNL), “Reevaluating the Worst-Case Post-Irradiation Response of MOS Transistors”, in Proceedings of the 1987 VHSIC/VLSI Qualifications, Reliability, and Logistics Workshop, Colorado Springs, Aug. 1987, prepared by Palisades Institute for Research Services, Inc., New York, 1987, pp. 293-302.

J.A. Lukanc, R.J. Veres, S.C. Boon, C.H. Boler, R.J. Byrne, S.E. Kerns, and L.W. Massengill, “A Fast, Radiation-Hardened VHSIC 2kx9 SRAM Within a Standard Cell Library,” Government Microcircuit Applications Conference Digest of Papers, vol. XIII, Nov. 1987.

L.W. Massengill, “RSIM – A Circuit Simulation Program for VLSI Interconnect Networks,” the Harvey Eckenrode Memorial ADI Student Paper Contest Winner presented at the Southeastern Computer Simulation Conference, 1987, Huntsville, AL, October, 1987. (Invited Presentation).

M.A. Xapsos, P. Shapiro, W.J. Stapor, A.B. Campbell, A.R. Knudson, L.W. Massengill, K.W. Fernald, and S.E. Kerns, “Static RAM Memory Upsets in a Combined Single-Event and Dose-Rate Environment,” Government Microcircuit Applications Conference Digest of Papers, vol. XIII, Nov. 1987.

S. S. Tsao, D. M. Fleetwood, L. Pfeiffer, G. K. Celler, V. Kaushik, B. Cowden, and A. K. Datye, “Island-Edge Effects in MOS/SOI Transistors”, SOS/SOI Workshop, Durango, CO, Oct. 6-8, 1987, pp. 33-34.

 

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