Radiation Effects and Reliability Group

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1985 Conference Presentations

L.W. Massengill, “Transient Radiation Upset Simulations in CMOS Digital ICs,” presented at the Microelectronics Center of North Carolina National Conference and Semi-Annual Research Review, Research Triangle Park, NC, March, 1985. (Invited Presentation)

L.W. Massengill and S.E. Diehl-Nagle, “Voltage Span Modeling for Very Large Memory Arrays,” Proceedings of the Fourth International Conference on the Numerical Analysis of Semiconductor Devices and Integrated Circuits (NASECODE IV), Boole Press Limited, Dublin, Ireland, 1985.

 

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