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MURI 2000 Agenda
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The Annual Meeting was held at Vanderbilt University, October 10-11, 2000PDF version of the talks are available (PDF link).
PowerPoint version of the talks are also posted (PPT link).
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This page will be updated as authors provide us with their presentation(s).
PowerPoint version of the talks are also posted (PPT link).
You may need to upgrade Acrobat Reader.
This page will be updated as authors provide us with their presentation(s).
October 10
8:30 | Welcoming Remarks Jerry Witt (e-mail), AFSOR |
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8:40 | Vanderbilt Welcome Ken Galloway (e-mail), Vanderbilt University |
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8:50 | Muri Overview Ron Schrimpf (e-mail, www), Vanderbilt University |
[PDF | PPT] | |
9:10 | Total-Dose Effects: Physical modeling, Simulation, and Measurement Ron Schrimpf (e-mail, www), Vanderbilt University |
[PDF | PPT] | |
9:30 | Atomic-Scale Modeling of Radiation-Induced Defects Sokrates Pantelides (e-mail), Vanderbilt university |
[PDF | PPT] | |
9:50 | Reactions of Mobile Hydrogen with Si-SiO2 Interface Sergey Rashkeev (e-mail), Vanderbilt university |
[PDF | PPT] | |
10:10 | Hydrogen-Related Defects in Irradiated SiO2 Paul Bunson (e-mail), Grinnell College |
[PDF | PPT] | |
10:30 | Break | ||
10:50 | Electrical Breakdown of Irradiated Oxides During Current-Temperature Stress Dan Fleetwood (e-mail, www), Vanderbilt University |
[PDF | PPT] | |
11:10 | Plans for Single-Event Dielectric Rupture Experiments Lloyd Massengill (e-mail, www), Vanderbilt University |
[PDF | PPT] | |
11:30 | Total Dose Effects in Composite Nitride-Oxide Films Ajay Raparla (e-mail), Vanderbilt University |
[PDF | PPT] | |
11:50 | Lunch | ||
12:45 | Laboratory Tours | ||
2:00 | Characterization of X-Ray Radiation Damage in Gate and Isolation Oxides Using Second Harmonic Generation Norm Tolk (e-mail), Vanderbilt University |
[PDF | PPT] | |
2:40 | Low Energy Electron-Excited Nanoscale Luminescence Detection of Trap Activation by Ionizing Radiation Len Brillson (e-mail, www), Ohio State University |
[PDF | DOC] | |
3:20 | Break | ||
3:40 | Radiation Effects in GaN and GaAs-on-Insulator Devices Eicke Weber (e-mail, www), University of California, Berkeley |
[PDF | PPT] | |
4:00 | Fast Proton Damage in Bulk Silicon Henning Feick (e-mail, www), University of California, Berkeley |
[PDF | PPT] | |
4:20 | Discussion | ||
6:30 | Dinner, Big River Restaurant & Brewery (Transportation available at 6:00 pm at Sarratt) |
October 11
8:30 | Application of Atomic-Resolution Z-Contrast STM to Radiation-Induced Defects Steve Pennycook (e-mail), Vanderbilt University and ORNL |
[PDF | PPT] | |
9:00 | Modeling Proton-Irradiation Effects in Photonic Devices Mark Neifeld (e-mail), University of Arizona |
[PDF | PPT] | |
9:40 | Break | ||
10:10 | The Transition from Thermally-Grown SiO2 to Deposited Thin Film Alternative Gate Dielectrics for Advanced CMOS Devices Gerry Lucovsky (e-mail), North Carolina State University |
[PDF | PPT] | |
10:50 | Status of AlGaN/GaN HEMTs and GOI Devices for Space Applications and Testing Strategy Umesh Mishra (e-mail), University of California, Santa Barbara |
[PDF | PPT] | |
11:30 | Feedback from Attendees | ||
12:00 | Meeting Ends |
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