Radiation Effects and Reliability Group

Cadence Tool Use – Using Cadence Tools for RF Degraded Performance Model Development » Id-Vg Curve for NMOSFET

Id-Vg for NMOSFET before irradiation and after 500 krad(SiO2) irradiation at 25 ºC There is an increase in OFF state leakage and decrease in ON state current with TID at both temperatures.


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